Thin Film Measurements and Characterization

4-point probe

Four point probe apparatus for sheet resistance measurements

CMI offers services for characterization of resistivity (sheet resistance) of semiconductors samples using four point probe apparatus.

CMI offers testing services for characterization of optical performance of samples, films and coatings:

  • Measurements of transmittance with UV-VIS Spectrometer
  • Measurements of reflectance with Integrating-sphere system
  • Measurements of film thickness and optical constants (refractive index and extinction coefficient) with ellipsometry (Sentech SE400adv-PV Ellipsometer Controller)